1. Proceedings
  2. I3M
  3. 2019
  4. IMAACA
  5. 10.46354/i3m.2019.imaaca.002

Failure prognosis of embedded systems based on temperature drift assessment

  • a Oussama Djedidi  , 
  • b Mohand A. Djeziri  , 
  • c Samir Benmoussa  
  • a,bAix Marseille University, Université de Toulon, CNRS, LIS, SASV, Marseille, France
  • cLaboratoire d’Automatique et de Signaux de Annaba (LASA), University Badji Mokhtar Annaba, 23000 Algeria
Cite as
Djedidi O., Djeziri M. A., Benmoussa S. (2019). Failure prognosis of embedded systems based on temperature drift assessment. Proceedings of the 12th International Conference on Integrated Modeling and Analysis in Applied Control and Automation (IMAACA 2019), pp. 11-16. DOI: https://doi.org/10.46354/i3m.2019.imaaca.002

Abstract

The Systems-on-Chip provide a large capacity for calculation and monitoring, so they are increasingly integrated into risky processes such as aeronautical and power generation systems. However, embedded systems are subject to degradation caused by wear, that can be accelerated by the often hostile environment. This paper proposes a method of failure prognosis of embedded systems based on the estimation of the temperature drift under reference operating conditions, then the modelling of the drift trend using a support vector regression model. The remaining useful life is estimated using the integral of the probability density function of the time to failure. Experimental results, evaluated by performance analysis techniques, show the effectiveness of the proposed approach.

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